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Alain Abran, Günter Büren, Reiner R. Dumke, Juan J. Cuadrado-Gallego, Jürgen Münch (Eds.)

Applied Software Measurement

Proceedings of the joined International Conferences on Software Measurement IWSM/MetriKon/Mensura 2010, 10.-12. November 2010, Vector Consulting Services, Stuttgart, Germany

ISBN: 978-3-8322-9618-6

Preis: 49,80 € / 99,60 SFR

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